Determining the Dielectric Tensor of Microtextured Organic Thin Films by Imaging Mueller Matrix Ellipsometry
نویسندگان
چکیده
Polycrystalline textured thin films with distinct pleochroism and birefringence comprising oriented rotational domains of the orthorhombic polymorph an anilino squaraine isobutyl side chains (SQIB) are analyzed by imaging Mueller matrix ellipsometry to obtain biaxial dielectric tensor. Simultaneous fitting transmission oblique incidence reflection scans combined spatial resolution optical microscope allows accurately determine full tensor from a single crystallographic sample orientation. Oscillator dispersion relations model well components. Strong intermolecular interactions cause real permittivity for all three directions become strongly negative near excitonic resonances, which is appealing nanophotonic applications.
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ژورنال
عنوان ژورنال: Journal of Physical Chemistry Letters
سال: 2021
ISSN: ['1948-7185']
DOI: https://doi.org/10.1021/acs.jpclett.1c00317